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Author Results for Moeller Stefan P

Cover is for reference only

X-ray free-electron lasers：beam diagnostics, beamline instrumentation, and applications : 13-16 August 2012, San Diego, California, United States

Corporate Authors: SPIE Society
Group Author: Hau-Riege Stefan P; Moeller Stefan P; Yabashi Makina
Published: SPIE,
Publication Dates: c2012.
Call Number: TN24-532/X1/2012

Book

Cover is for reference only

X-ray free-electron lasers: beam diagnostics, beamline instrumentation, and applications II : 18-19 August 2014, San Diego, California, United States /

Corporate Authors: Society of Photo-optical Instrumentation Engineers United States
Group Author: Hau-Riege, Stefan P; Moeller, Stefan P; Yabashi, Making
Published: SPIE,
Publication Dates: 2014.
Call Number: TN24-532/X1/2014

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