Fringe pattern analysis for optical metrology : theory, algorithms, and applications /

Main Authors: Servín, Manuel
Group Author: Quiroga, J. Antonio Juan Antonio; Padilla, J. Moisés José Moisés
Published: Wiley-VCH Verlag GmbH & Co. KGaA,
Publication Dates: [2014]
Call Number: O432.2/S492