Author Results for Pougnet, Philippe,

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Elsevier Science & Technology

9
Nanometer-scale defect detection using polarized light /

Cover is for reference only
Main Authors: Dahoo, Pierre Richard
Group Author: Pougnet, Philippe; Hami, Abdelkhalak El
Published: ISTE,
Publication Dates: 2016.
Call Number: TB303/D131
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10
Embedded mechatronic systems.

Cover is for reference only
Group Author: El Hami, Abdelkhalak; Pougnet, Philippe
Published: ISTE Press ; Elsevier,
Publication Dates: 2015.
Call Number: TH-39/E532/v.2
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11
Embedded mechatronic systems.

Cover is for reference only
Group Author: El Hami, Abdelkhalak; Pougnet, Philippe
Published: ISTE Press ; Elsevier,
Publication Dates: 2015.
Call Number: TP271/E532/v.1
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