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1

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Practical analytical electron microscopy in materials science

Main Authors: Williams David B (David Bernard), 1949-
Published: Verlag Chemie International Electron Optics Pub. Co.,
Publication Dates: c1984]
Call Number: TN153/W722/

Book

2

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Microbeam analysis 2000：proceedings of the Second Conference of the International Union of Microbeam Analysis Societies held in Kailua-Kona, Hawaii, 9-14 July 2000

Corporate Authors: International Union of Microbeam Analysis Societies. Conference (2nd 2000 Kailua Kona, Hawaii) (2000)
Group Author: Williams David B.; (David Bernard), 1949-; Shimizu R.; (Ryūichi), 1937-
Published: Institute of Physics Publishing,
Publication Dates: c2000.
Call Number: TN16-532/M626/2000

Book

3

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Transmission electron microscopy：a textbook for materials science

Main Authors: Williams David B. (David Bernard), 1949-
Corporate Authors: SpringerLink (Online service)
Group Author: Carter C. Barry.
Published: Springer,
Publication Dates: c2009.

Book

4

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X-ray spectrometry in electron beam instruments

Group Author: Williams David B.; (David Bernard), 1949-; Goldstein Joseph, 1939-; Newbury Dale E.
Published: Plenum Press,
Publication Dates: c1995.
Call Number: O434.12/X8/

Book

5

Cover is for reference only

Images of materials

Group Author: Williams David B.; (David Bernard), 1949-; Pelton Alan R.; Gronsky R.; (Ronald)
Published: Oxford University Press,
Publication Dates: 1991.
Call Number: TB303/I31/

Book

6

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Materials problem solving with the transmission electron microscope：symposium held December 2-4, 1985, Boston, Massachusetts, USA

Corporate Authors: Materials Research Society
Group Author: Hobbs L. W.; Westmacott K. H.; (Kenneth H.); Williams David B.; (David Bernard), 1949-
Published: Materials Research Society,
Publication Dates: c1986.
Call Number: TB302.3-53/M425.1/1985/

Book

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