International Conference on Optical Diagnosis of Materials and Devices for Opto-, Micro-, and Quantum Electronics 1997:13-15 May 1997, Kiev, Ukraine
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Corporate Authors: | ; ; ; |
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Group Author: | ; ; |
Published: |
SPIE,
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Publisher Address: | Bellingham, Wash., USA |
Publication Dates: | c1998. |
Literature type: | Book |
Language: | English |
Series: |
SPIE proceedings series ; v. 3359 |
Subjects: | |
Carrier Form: | xiii, 564 p.: ill. ; 28 cm. |
ISBN: | 0819428086 |
Index Number: | TN20 |
CLC: |
TN20-532 TN04-532 TN40-532 |
Call Number: | TN20-532/I61/1997/ |
Contents: | Includes bibliographical references and index. |