Cover is for reference only

The three faces of test：design, characterization, production : International Test Conference, 1984 proceedings, October 16, 17, 18, 1984

Saved in:
Bibliographic Details
Corporate Authors: International Test Conference (15th 1984 Philadelphia, Pa; IEEE Computer Society. Test Technology Committee; Institute of Electrical and Electronics Engineers. Philadelphia Section
Published: IEEE Computer Society Press,
Publisher Address: Silver Spring, MD
Publication Dates: c1984.
Literature type: Book
Language: English
Subjects:
Integrated circuits > Testing > Congresses
Semiconductors > Testing > Congresses
Carrier Form: xxxi, 886 p.: ill. ; 28 cm.
ISBN: 0818605480 (pbk.)
0818645482 (microfiche)
0818685484 (hard)
Index Number: TP306
CLC: TP306-532
Call Number: TP306-53/I61/1984/
Contents: Spine title: International Test Conference 1984 proceedings.
"IEEE catalog no. 84CH2084-2."
"Computer Society order no. 548."
Includes bibliographical references and index.

Related Book Recommendations