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Testing's impact on design & technology：International Test Conference, 1986, proceedings, September 8, 9, 10, 11, 1986

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Bibliographic Details
Corporate Authors: International Test Conference (1986 Washington, D.C; IEEE Computer Society; Institute of Electrical and Electronics Engineers. Philadelphia Section
Published: IEEE Computer Society Press,
Publisher Address: Washington, D.C.
Publication Dates: c1986.
Literature type: Book
Language: English
Subjects:
Integrated circuits > Testing > Congresses
Semiconductors > Testing > Congresses
Carrier Form: xxx, 1009 p.: ill. ; 28 cm.
ISBN: 0818607262 (pbk.)
0818647264 (microfiche)
0818687266 (hard)
Index Number: TP306
CLC: TP306-532
Call Number: TP306-53/I61/1986/
Contents: "IEEE catalog no. 86CH2339-0."
Includes bibliographies and index.

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