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Defect oriented testing for CMOS analog and digital circuits

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Bibliographic Details
Main Authors: Sachdev Manoj
Published: Kluwer Academic,
Publisher Address: Boston
Publication Dates: c1998.
Literature type: Book
Language: English
Series: Frontiers in electronic testing
Subjects:
Metal oxide semiconductors, Complementary > Testing
Metal oxide semiconductors, Complementary > Defects
Linear integrated circuits > Testing
Digital integrated circuits > Testing
Carrier Form: xiv, 308 p.: ill. ; 25 cm.
ISBN: 0792380835 (hardbound : alk. paper)
Index Number: TN432
CLC: TN432.07
Call Number: TN432.07/S121/
Contents: Includes bibliographical references and index.

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