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2nd European Congress on Optics Applied to Metrology (METROP)：presented as part of the Optics, Photonics, and Iconics Engineering Meeting (OPIEM), November 26-30, 1979, Strasbourg, France

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Bibliographic Details
Corporate Authors: European Congress on Optics Applied to Metrology (2d 1979 Strasbourg; European Photonics Association; Society of Photo-Optical Instrumentation Engineers; Optics, Photonics, and Iconics Engineering Meeting (1979 Strasbourg, France)
Group Author: Meyrueis Patrick; Grosmann Michel
Published: Society of Photo-optical Instrumentation Engineers,
Publisher Address: Bellingham, Wash.
Publication Dates: c1980.
Literature type: Book
Language: English
Series: Proceedings of the Society of Photo-optical Instrumentation Engineers ; v. 210
Subjects:
Holographic interferometry > Congresses
Speckle metrology > Congresses
Optical measurements > Congresses
Carrier Form: x, 228 p.: ill. ; 28 cm.
ISBN: 0892522380
Index Number: TB9
CLC: TB9-532
Call Number: TB9-53/E89/1979/
Contents: Includes bibliographical references and indexes.

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