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VLSI test principles and architectures：design for testability

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Bibliographic Details
Group Author: Wang Laung-Terng; Wu Cheng-Wen, EE Ph. D; Wen Xiaoqing
Published: Elsevier Morgan Kaufmann Publishers,
Publisher Address: Amsterdam
Publication Dates: c2006.
Literature type: Book
Language: English
Series: The Morgan Kaufmann series in systems on silicon
Subjects:
Integrated circuits > Very large scale integration > Testing
Integrated circuits > Very large scale integration > Design
Carrier Form: xxx, 777 p.: ill. ; 25 cm.
ISBN: 0123705975 (hardcover : alk. paper)
9780123705976 (hardcover : alk. paper)
Index Number: TN47
CLC: TN47
Call Number: TN47/V871
Contents: Includes bibliographical references and index.

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