VLSI testing

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Bibliographic Details
Group Author: Williams T. W 1943-
Published: North-Holland Sole distributors for the U.S.A. and Canada, Elsevier Science Pub. Co.,
Publisher Address: Amsterdam New York New York, N.Y., U.S.A.
Publication Dates: 1986.
Literature type: Book
Language: English
Series: Advances in CAD for VLSI ; v. 5
Subjects:
Carrier Form: ix, 275 p.: ill. ; 25 cm.
ISBN: 0444878955 (U.S.)
Index Number: TN47
CLC: TN47
Contents: Includes bibliographies.