Screen LibraryProceedings of the 12th International Symposium on the Physical & Failure Analysis of Integrated Circuits：IPFA 2005 : [27 June to 1 July 2005, Shangri-La's rasa Sentosa Resort, Singapore]
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| Corporate Authors: | ; ; |
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| Group Author: | |
| Published: |
IEEE,
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| Publisher Address: | Piscataway, N.J. |
| Publication Dates: | c2005. |
| Literature type: | Book |
| Language: | English |
| Subjects: | |
| Carrier Form: | 327 p.: ill. ; 30 cm. |
| Publication Frequency: | Also issued online with additional title: Physical and Failure Analysis of Integrated Circuits, 2005, IPFA 2005, Proceedings of the 12th International Symposium on the. |
| ISBN: | 0780393015 (pbk.) |
| Index Number: | TN4 |
| CLC: | TN4-532 |
| Call Number: | TN4-532/I61.6/2005 |
| Contents: |
"IEEE Catalog Number 05TH8827"--T.p. verso. Includes bibliographical references and authors index. |