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Proceeding of the 15th International Symposium on the Physical & Failure Analysis of Integrated Circuits：IPFA 2008

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Bibliographic Details
Corporate Authors: International Symposium on the Physical and Failure Analysis of Integrated Circuits (15th 2008 Singapore
Group Author: Lip Gan Chee; Radhakrishnan M. K
Published: IEEE Reliability Society,
Publisher Address: Piscataway, NJ
Publication Dates: c2008.
Literature type: Book
Language: English
Subjects:
Integrated circuits > Defects
Integrated circuits > Testing
Integrated circuits > Reliability
Carrier Form: 342 p.: ill. ; 30 cm.
ISBN: 9781424420391
1424420393
Index Number: TN4
CLC: TN4-532
Call Number: TN4-532/I61.6/2008
Contents: "7 to 11 July 2008 JSingapore." --Cover.
"IEEE catalog number CEP08777-PRT."--T.p. verso.
Includes bibliographical references and author index.

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