Screen LibraryBeam injection assessment of microstructures in semiconductors：BIAMS 2000 : proceedings of the 6th International Workshop on Beam Injection Assessment of Mictrostructures in Semiconductors held in Fukuoka, Japan, November 12-16, 2000
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| Corporate Authors: | |
|---|---|
| Published: |
Scitec Publications,
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| Publisher Address: | Uetikon-Zuerich, Switzerland |
| Publication Dates: | c2001. |
| Literature type: | Book |
| Language: | English |
| Series: |
Diffusion and defect data - solid state data - Pt. B: Solid state phenomena ; v. 78-79 (2000) |
| Subjects: | |
| Carrier Form: | XIII, 441 p.: ill. ; 25 cm. |
| ISBN: | 3908450616 (pbk.) |
| Index Number: | TN303 |
| CLC: |
TN303-532 TN304.07-532 |
| Call Number: | TN304.07-532/I618/2000 |