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From contamination to defects, faults, and yield loss：simulation and applications

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Bibliographic Details
Main Authors: Khare Jitendra B
Group Author: Maly W
Published: Kluwer Academic Publishers,
Publisher Address: Boston
Publication Dates: c1996.
Literature type: Book
Language: English
Series: Frontiers in electronic testing
Subjects:
Integrated circuits > Testing
Integrated circuits > Very large scale integration > Testing
Integrated circuits > Very large scale integration > Defects
Integrated circuits > Very large scale integration > Computer simulation
Computer-aided design
Carrier Form: 150 p.: ill. ; 24 cm.
ISBN: 0792397142 (acid-free paper)
Index Number: TN470
CLC: TN470.7
TN470.5
Call Number: TN470.5/K45/
Contents: Includes bibliographical references and index.

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