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18th IEEE VLSI Test Symposium：proceedings : 30 April-4 May 2000, Montr鈋al, Qu鈋bec, Canada

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Bibliographic Details
Corporate Authors: IEEE VLSI Test Symposium (18th 2000 Montr鈋al, Qu鈋bec; IEEE Computer Society. Test Technology Technical Committee; Institution of Electrical and Electronics Engineers
Published: IEEE,
Publisher Address: Los Alamitos, Calif.
Publication Dates: c2000.
Literature type: Book
Language: English
Subjects:
Integrated circuits > Very large scale integration > Testing
Carrier Form: xxxix, 478 p.: ill. ; 28 cm.
ISBN: 0769506135
0769506151 (microfiche)
Index Number: TN470
CLC: TN470.7-532
TN47-532
Call Number: TN47-532/I59/2000/
Contents: "IEEE Computer Society order number PR00613"--T.p. verso.
Includes bibliographical references and index.

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