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2010 28th VLSI Test Symposium：19-22 April, 2010, Santa Cruz, California.

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Bibliographic Details
Corporate Authors: VLSI Test Symposium 28th 2010 Santa Cruz, California; IEEE
Published: IEEE
Publisher Address: Piscataway, N.J.
Publication Dates: c2010.
Literature type: Book
Language: English
Subjects:
Integrated circuits > Very large scale integration > Testing
Carrier Form: xxvii, 358 p.: ill. ; 28 cm.
ISBN: 9781424466498
Index Number: TN470
CLC: TN470.7-532
TN47-532
Call Number: TN47-532/I59-2/2010
Contents: Includes bibliographical references and author index.

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