Hot-carrier reliability of MOS VLSI circuits
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Main Authors: | |
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Group Author: | |
Published: |
Kluwer Academic,
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Publisher Address: | Boston |
Publication Dates: | c1993. |
Literature type: | Book |
Language: | English |
Series: |
The Kluwer international series in engineering and computer science ; SECS 227. |
Subjects: | |
Carrier Form: | xvi, 212 p.: ill. ; 25 cm. |
ISBN: | 079239352X |
Index Number: | TN470 |
CLC: | TN470.6 |
Call Number: | TN470.6/L445/ |
Contents: | Includes bibliographical references and index. |