Fringe pattern analysis for optical metrology : theory, algorithms, and applications /

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Bibliographic Details
Main Authors: Servín, Manuel
Group Author: Quiroga, J. Antonio Juan Antonio; Padilla, J. Moisés José Moisés
Published: Wiley-VCH,
Publisher Address: Weinheim :
Publication Dates: [2014]
©2014
Literature type: eBook
Language: English
Edition: First edition.
Subjects:
Online Access: http://onlinelibrary.wiley.com/book/10.1002/9783527681075
Item Description: Edition statement from running title area.
Carrier Form: 1 online resource (xvi, 328 pages) : illustrations
Bibliography: Includes bibliographical references and index.
ISBN: 1306840880
9781306840880
9783527681082
3527681086
Index Number: QC39
CLC: O432.2