Screen LibraryApplications and metrology at nanometer scale. 2, Measurement systems, quantum engineering and RBDO method/
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| Main Authors: | |
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| Corporate Authors: | |
| Group Author: | ; |
| Published: |
ISTE Ltd / John Wiley and Sons Inc,
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| Publisher Address: | Hoboken : |
| Publication Dates: | 2020. |
| Literature type: | eBook |
| Language: | English |
| Series: |
Reliability of multiphysical systems set ; Volume 10 |
| Subjects: | |
| Online Access: |
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119818984 |
| Item Description: | Description based on print version record. |
| Carrier Form: |
1 online resource (276 pages). Also available in print. |
| ISBN: |
9781119818984 (electronic bk.) 9781786306876 |
| CLC: | TB9 |