Screen LibraryApplications and metrology at nanometer scale. 1, Smart materials, electromagnetic waves and uncertainties/
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| Main Authors: | |
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| Corporate Authors: | |
| Group Author: | ; |
| Published: |
ISTE Ltd. ; Wiley,
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| Publisher Address: | London : Hoboken : |
| Publication Dates: | 2021. |
| Literature type: | eBook |
| Language: | English |
| Series: |
Mechanical engineering and solid mechanics series. Reliability of multiphysical systems set ; v. 9 |
| Subjects: | |
| Online Access: |
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119808244 |
| Item Description: | Description based on print version record. |
| Carrier Form: |
1 online resource (248 pages). Also available in print. |
| Bibliography: | Includes bibliographical references and index. |
| ISBN: |
9781119808244 1786306409 9781786306401 |
| Index Number: | QC88 |
| CLC: | TB9 |
| Contents: | Nanometer Scale -- Statistical Tools to Reduce the Effect of Design Uncertainties -- Electromagnetic Waves and Their Applications -- Smart Materials -- Propagation of a Light Ray -- References -- Index -- Other titles from iSTE in Mechanical Engineering and Solid Mechanics. |