High resolution X-ray diffractometry and topography

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Bibliographic Details
Main Authors: Bowen D. Keith (David Keith), 1940-
Group Author: Tanner B. K.; (Brian Keith)
Published: Taylor & Francis,
Publisher Address: London Bristol, PA
Publication Dates: c1998.
Literature type: Book
Language: English
Subjects:
Carrier Form: x, 252 p.: ill. ; 28 cm.
ISBN: 0850667585
Index Number: TN04
CLC: TN04-34
O766
Call Number: O766/B786
Contents: Includes bibliographical references and index.