Author Results for Bowen D. Keith (David Keith), 1940-

Bowen,D. Keith
(Brian Keith)
Tanner,B. K.
(David Keith),
D. K. Bowen, C. R. Hall
see all »
D. Keith Bowen and Brian K. Tanner
D. Keith Bowen, Brian K. Tanner
Knight,Larry V.
NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-ray Methods,Durham, England)
NetLibrary, Inc

1
X-ray metrology in semiconductor manufacturing

Cover is for reference only
Main Authors: Bowen D. Keith (David Keith), 1940-
Group Author: Tanner B. K.; (Brian Keith)
Published: CRC/Taylor & Francis,
Publication Dates: 2006.
Call Number: TN302/B786
Book
Save to List
Saved in:
2
High resolution X-ray diffractometry and topography

Cover is for reference only
Main Authors: Bowen D. Keith (David Keith), 1940-
Corporate Authors: NetLibrary, Inc.
Group Author: (Brian Keith); Tanner B. K.
Published: Taylor & Francis,
Publication Dates: c1998.
Book
Save to List
Saved in:
3
High resolution X-ray diffractometry and topography

Cover is for reference only
Main Authors: Bowen D. Keith (David Keith), 1940-
Group Author: Tanner B. K.; (Brian Keith)
Published: Taylor & Francis,
Publication Dates: c1998.
Call Number: O766/B786
Book
Save to List
Saved in:
5
Microscopy of materials modern imaging methods using electron, X-ray, and ion beams

Cover is for reference only
Main Authors: Bowen D. Keith (David Keith), 1940- (D. K. Bowen, C. R. Hall.)
Group Author: Hall Christopher Roxby (joint author.)
Published: Wiley,
Publication Dates: 1975.
Call Number: TB302.1/B786/
Book
Save to List
Saved in:
6
X-ray imaging II 21-22 August 1986, San Diego, California

Cover is for reference only
Corporate Authors: University of Rochester. Institute of Optics.; Society of Photo-Optical Instrumentation Engineers
Group Author: Knight Larry V.; Bowen D. Keith; (David Keith), 1940-
Published: SPIE--the International Society for Optical Engineering,
Publication Dates: c1986.
Call Number: R814-53/X1/1986/
Book
Save to List
Saved in:
Search Tools: Get RSS Feed — Email this Search —