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1

$X-ray diffraction topography /$

Cover is for reference only

Main Authors: Tanner, B. K. Brian Keith
Corporate Authors: Elsevier Science & Technology
Published: Pergamon Press,
Publication Dates: 1976.

eBook

2

$X-ray diffraction topography$

Cover is for reference only

X-ray diffraction topography

Main Authors: Tanner B. K (Brian Keith)
Published: Pergamon Press,
Publication Dates: 1976.
Call Number: O721/T166/

Book

3

Cover is for reference only

Rare earths and actinides, 1977：invited and contributed papers from the International Conference on Rare Earths and Actinides held in Durham, 4-6 July 1977

Corporate Authors: International Conference on Rare Earths and Actinides (1977 Durham, Eng.); Institute of Physics (1971- ). Solid State Physics Sub-Committee.
Group Author: Tanner B. K.; (Brian Keith); Corner William Derek.
Published: Institute of Physics,
Publication Dates: c1978.
Call Number: O614.35-53/I61.2/1977/

Book

4

$X-ray and neutron dynamical diffraction theory and applications$

Cover is for reference only

X-ray and neutron dynamical diffraction：theory and applications

Corporate Authors: North Atlantic Treaty Organization. Scientific Affairs Division.; NATO Advanced Study Institute on X-ray and Neutron Dynamical Diffraction (1996 Erice, Italy) (Erice, Italy))
Group Author: Authier André.; Lagomarsino Stefano.; Tanner B. K.; (Brian Keith)
Published: Plenum Press,
Publication Dates: c1996.
Call Number: TB302.5-532/X8/1996/

Book

5

$High resolution X-ray diffractometry and topography$

Cover is for reference only

High resolution X-ray diffractometry and topography

Main Authors: Bowen D. Keith (David Keith), 1940-
Group Author: Tanner B. K.; (Brian Keith)
Published: Taylor & Francis,
Publication Dates: c1998.
Call Number: O766/B786

Book

6

Cover is for reference only

Characterization of crystal growth defects by X-ray methods：[proceedings of NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-ray Methods, held August 29-September 10, 1979, at Durham University, Durham, United Kingdom]

Corporate Authors: NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-ray Methods (1979 Durham, England)
Group Author: Tanner B. K.; (Brian Keith); Bowen D. Keith; (David Keith), 1940-
Published: Plenum Press,
Publication Dates: c1980.
Call Number: O77-53/N864/1979/

Book

7

Cover is for reference only

X-ray metrology in semiconductor manufacturing

Main Authors: Bowen D. Keith (David Keith), 1940-
Group Author: Tanner B. K.; (Brian Keith)
Published: CRC/Taylor & Francis,
Publication Dates: 2006.
Call Number: TN302/B786

Book

8

$High resolution X-ray diffractometry and topography$

Cover is for reference only

High resolution X-ray diffractometry and topography

Main Authors: Bowen D. Keith (David Keith), 1940-
Corporate Authors: NetLibrary, Inc.
Group Author: (Brian Keith); Tanner B. K.
Published: Taylor & Francis,
Publication Dates: c1998.

Book

9

Cover is for reference only

Common problems in acute care surgery /

Corporate Authors: SpringerLink (Online service)
Group Author: Moore, Laura J.; Turner, Krista L.; Todd, S. Rob
Published: Springer,
Publication Dates: 2013.

eBook

10

Cover is for reference only

Energy, sustainability, and the environment : technology, incentives, behavior /

Corporate Authors: Elsevier Science & Technology.
Group Author: Sioshansi, Fereidoon P. (Fereidoon Perry) (Editor)
Published: Butterworth-Heinemann,
Publication Dates: 2011.

eBook

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