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Delay fault testing for VLSI circuits

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Bibliographic Details
Main Authors: Krstić Angela, 1965-
Group Author: Cheng Kwang-Ting, 1961-
Published: Kluwer Academic Publishers,
Publisher Address: Boston
Publication Dates: c1998.
Literature type: Book
Language: English
Series: Frontiers in electronic testing
Subjects:
Integrated circuits > Very large scale integration > Testing.
Delay faults (Semiconducotrs)
Carrier Form: xii, 191 p.: ill. ; 24 cm.
ISBN: 0792382951 (alk. paper)
Index Number: TN470
CLC: TN470.7
Call Number: TN470.7/K939
Contents: Includes bibliographical references (p. [173]-188) and index.

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