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$High resolution X-ray diffractometry and topography$

Cover is for reference only

High resolution X-ray diffractometry and topography

Main Authors: Bowen D. Keith (David Keith), 1940-
Group Author: Tanner B. K.; (Brian Keith)
Published: Taylor & Francis,
Publication Dates: c1998.
Call Number: O766/B786

Book

2

Cover is for reference only

Characterization of crystal growth defects by X-ray methods：[proceedings of NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-ray Methods, held August 29-September 10, 1979, at Durham University, Durham, United Kingdom]

Corporate Authors: NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-ray Methods (1979 Durham, England)
Group Author: Tanner B. K.; (Brian Keith); Bowen D. Keith; (David Keith), 1940-
Published: Plenum Press,
Publication Dates: c1980.
Call Number: O77-53/N864/1979/

Book

3

Cover is for reference only

X-ray metrology in semiconductor manufacturing

Main Authors: Bowen D. Keith (David Keith), 1940-
Group Author: Tanner B. K.; (Brian Keith)
Published: CRC/Taylor & Francis,
Publication Dates: 2006.
Call Number: TN302/B786

Book

4

$High resolution X-ray diffractometry and topography$

Cover is for reference only

High resolution X-ray diffractometry and topography

Main Authors: Bowen D. Keith (David Keith), 1940-
Corporate Authors: NetLibrary, Inc.
Group Author: (Brian Keith); Tanner B. K.
Published: Taylor & Francis,
Publication Dates: c1998.

Book

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