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61

Cover is for reference only

2020 IEEE 38th International Conference on Computer Design : (ICCD 2020) : Hartford, Connecticut, USA, 18-21 October 2020.

Corporate Authors: IEEE International Conference on Computer Design Online); Institute of Electrical and Electronics Engineers.; IEEE Computer Society; IEEE Circuit and Systems Society
Published: IEEE,
Publication Dates: [2020]
Call Number: TP302-532/I59.1/2020

Book

62

Cover is for reference only

2010 IEEE International Integrated Reliability Workshop final report：(IRW 2010), S. Lake Tahoe, California, 17-21 October 2010.

Corporate Authors: International Integrated Reliability Workshop (2010 S. Lake Tahoe, California; Institute of Electrical and Electronic Engineers
Published: IEEE
Publication Dates: c 2010.
Call Number: TN406-532/I61/2010

Book

63

Cover is for reference only

2009 21st International Symposium on Power Semiconductor Devices & Ic's, ISPSD：Barcelona, Spain, 14-18 June 2009.

Corporate Authors: International Symposium on Power Semiconductor Devices & ICs (21st 2009 Barcelona, Spain; Institute of Electrical and Electronics
Published: IEEE Service Center,
Publication Dates: c2009.
Call Number: TN303-532/I61/2009

Book

64

Cover is for reference only

62nd DRC：Device Research Conference : conference digest : June 21-23, 2004, University of Notre Dame, Notre Dame, Indiana

Corporate Authors: Device Research Conference (62st 2004 Notre Dame, Ind; IEEE Electron Devices Society; Institute of Electrical and Electronics Engineers
Published: IEEE,
Publication Dates: c2004.
Call Number: TN103-532/D492/2004

Book

65

Cover is for reference only

2022 IEEE 34th International Conference on Microelectronic Test Structures : (ICMTS 2022) : Cleveland, Ohio, USA, 21-23 March 2022.

Corporate Authors: IEEE International Conference on Microelectronic Test Structures Cleveland, Ohio, USA); Institute of Electrical and Electronics Engineers.
Published: IEEE,
Publication Dates: [2022]
Call Number: TN407-532/I61/2022

Book

66

Cover is for reference only

2022 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits : (IPFA 2022) : Singapore, 18-21 July 2022.

Corporate Authors: International Symposium on the Physical & Failure Analysis of Integrated Circuits Singapore); Institute of Electrical and Electronics Engineers.
Published: IEEE,
Publication Dates: [2022]
Call Number: TN4-532/I61.6/2022

Book

67

Cover is for reference only

Photomask Japan 2021: XXVII Symposium on Photomask and Next-Generation Lithography Mask Technology : 20-21 April 2021, Online only, Japan /

Corporate Authors: Symposium on Photomask and Next-Generation Lithography Mask Technology Online only, Japan); Photomask Japan; SPIE (Society); Bahamas Association for Cultural Studies; Experimental Manpower Laboratory for Corrections; The Japan Society of Applied Physics.; The Japan Society of Precision Engineering; The Institute of Electrical Engineering Japan; Technical Exhibit in Cooperation with SEMI Japan
Group Author: Ando, Akihiko
Published: SPIE,
Publication Dates: [2021]
Call Number: TN305.7-532/P757/2021

Book

68

Cover is for reference only

1998 5th International Conference on Solid-State and Integrated Circuit Technology：proceedings, October 21-23 : 1998, Beijing, China

Corporate Authors: International Conference on Solid-State and Integrated Circuit Technology (5th 1998 Beijing, China; Chung-kuo tien tzu hsüeh hui; IEEE Electron Devices Society; IEEE Solid-State Circuits Society
Group Author: Zhang Min; Tu K. N; King-ning 1937-
Published: Institute of Electrical and Electronics Engineers,
Publication Dates: [1998].
Call Number: TN4-532/I61.10/1998/

Book

69

Cover is for reference only

Designing, testing, and diagnostics--join them : International Test Conference 1993 proceedings :October 17-21, 1993, Convention Center, Baltimore, Maryland, USA /

Corporate Authors: International Test Conference Baltimore, Md; IEEE Computer Society. Test Technology Technical Committee; Institute of Electrical and Electronics Engineers. Philadelphia Section
Published:
Call Number: TN407-532/I594/1993

Book

70

Cover is for reference only

VLSI 81：very large scale integration : proceedings of the Conference, held at the University of Edinburgh, 18-21 Aug., 1981

Group Author: Gray John P
Published: Academic Press,
Publication Dates: 1981.
Call Number: TN47-53/I61/1981/

Book

71

Cover is for reference only

2019 IEEE 32nd International Conference on Microelectronic Test Structures : (ICMTS 2019) : Kitakyushu City, Fukuoka, Japan, 18-21 March 2019.

Corporate Authors: IEEE International Conference on Microelectronic Test Structures Kitakyushu City, Fukuoka, Japan; Institute of Electrical and Electronics Engineers
Published: IEEE,
Publication Dates: [2019]
Call Number: TN407-532/I61/2019

Book

72

Cover is for reference only

2004 IEEE International Conference on Acoustics, Speech, and Signal Processing：proceedings : May 17-21, 2004, Fairmont Queen Elizabeth Hotel, Montreal, Quebec, Canada

Corporate Authors: ICASSP (29th 2004 Montreal, Quebec; IEEE Signal Processing Society
Published: IEEE,
Publication Dates: c2004.
Call Number: TN911.7-532/I59.1/2004/v.1

Book

73

Cover is for reference only

GaAs IC Symposium：IEEE Gallium Arsenide Integrated Circuit Symposium : 23rd annual : technical digest 2001 : Baltimore, Maryland, October 21-24, 2001

Corporate Authors: IEEE Gallium Arsenide Integrated Circuit Symposium (23rd 2001 Seattle, Washington; IEEE Microwave Theory and Techniques Society; IEEE Solid-State Circuits Society; IEEE Electron Devices Society
Published: IEEE],
Publication Dates: c2000.
Call Number: TN43-532/I59.3/2001

Book

74

Cover is for reference only

GaAs IC Symposium：IEEE Gallium Arsenide Integrated Circuit Symposium : 21st annual : technical digest 1999 : Monterey, California, October 17-20, 1999

Corporate Authors: IEEE Gallium Arsenide Integrated Circuit Symposium (21st 1999 Monterey, Calif; IEEE Electron Devices Society; IEEE Microwave Theory and Techniques Society; IEEE Solid-State Circuits Society
Published: IEEE,
Publication Dates: c1999.
Call Number: TN43-532/I59.3/1999/

Book

75

Cover is for reference only

Proceedings of the Second Caltech Conference on Very Large Scale Integration：held at the California Institute of Technology, 12-21 January, 1981

Corporate Authors: Caltech Conference on Very Large Scale Integration (2nd 1981 Pasadena, Calif
Group Author: Seitz Charles L
Published: Caltech Computer Science Dept,
Publication Dates: 1981.
Call Number: TN47-532/C166/1981

Book

76

Cover is for reference only

Mikroelektronik：Vortr··age der gleichnamigen Tagung des "Internationalen Elektronik Arbeitskreises eV" (INEA) in M··unchen vom 21. bis 23. Oktober 1964

Corporate Authors: Tagung Mikroelektronik (1964 Munich, Germany)
Group Author: Steipe Leo
Published: R. Oldenbourg,
Publication Dates: 1965.
Call Number: TN4-532/M636/1964

Book

77

Cover is for reference only

2004 7th International Conference on Solid-State and Integrated Circuits Technology：proceedings : ISICT 2004 : October 18-21, 2004, Beijing, China

Corporate Authors: International Conference on Solid-State and Integrated Circuit Technology (7th 2004 Beijing, China; Zhongguo dian zi xue hui
Group Author: Huang Ru
Published: IEEE Press,
Publication Dates: c2004.
Call Number: TN4-532/I613/2004/v.1

Book

78

Cover is for reference only

Electron-beam, X-ray, EUV, and ion-beam submicrometer lithographies for manufacturing V：20-21 February 1995, Santa Clara, California

Corporate Authors: Semiconductor Equipment and Materials International; Society of Photo-Optical Instrumentation Engineers
Group Author: Warlaumont John M
Published: SPIE,
Publication Dates: c1995.
Call Number: TN27-532/E38/1995

Book

79

Cover is for reference only

ISPSD '92：proceedings of the 4th International Symposium on Power Semiconductor Devices & ICs, May 19-21, 1992, Waseda University, Tokyo, Japan

Corporate Authors: International Symposium on Power Semiconductor Devices & ICs (4th 1992 Waseda University, Tokyo, Japan; Denki Gakkai 1888. Technical Committee on Electron Devices; IEEE Electron Devices Society
Published: The Institute,
Publication Dates: c1992.
Call Number: TN303-532/I61/1992

Book

80

Cover is for reference only

2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits : (IPFA 2016) : Singapore, 18-21 July 2016.

Corporate Authors: IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits Singapore; Institute of Electrical and Electronic Engineers
Published: IEEE,
Publication Dates: [2016]
Call Number: TN4-532/I61.6/2016

Book

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