Author Results for 21


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Integrated circuits Very large scale integration 48 Semiconductors 24 Design and construction 23 Congresses 20 Testing 16 Reliability 12 more ...
1
Corporate Authors: Society of Photo-Optical Instrumentation Engineers
Group Author: Fossum Eric R
Published: The Society,
Publication Dates: c1992.
Call Number: TN21-532/I43.1/1992/
Book
5
Corporate Authors: SEMATECH, Inc; Society of Photo-Optical Instrumentation Engineers
Group Author: Flagello Donis G
Published: SPIE,
Publication Dates: c2006.
Call Number: TS828-532/O62/2006
Book
6
Corporate Authors: Society of Photo-Optical Instrumentation Engineers
Group Author: Murarka Shyam P; Chen Fusen E
Published: SPIE,
Publication Dates: c1994.
Call Number: TN405-532/M626.1/1994/
Book
8
Corporate Authors: Society of Photo-Optical Instrumentation Engineers
Group Author: Vasquez Barbara
Published: SPIE,
Publication Dates: c1993.
Call Number: TN40-532/M626/1992/
Book
9
Corporate Authors: Society of Photo-Optical Instrumentation Engineers
Group Author: Eldada Louay A; Lee El-Hang
Published: SPIE,
Publication Dates: c2008.
Call Number: TN491-532/O62/2008
Book
12
Corporate Authors: International Test Conference (2007 Santa Clara, CA; IEEE Xplore Online service; Institute of Electrical and Electronics Engineers
Published: Institute of Electrical and Electronics Engineers,
Publication Dates: c2007.
Call Number: TN407-532/I594/2007
Book
15
Group Author: Swenson Edward J
Published: SPIE--the International Society for Optical Engineering,
Publication Dates: c1986.
Call Number: TN405-53/L343/1986/
Book
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