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1

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Computational modeling in semiconductor processing

Group Author: Meyyappan M
Published: Artech House,
Publication Dates: c1995.
Call Number: TN305/C738/

Book

2

Cover is for reference only

Inorganic nanowires：applications, properties, and characterization

Main Authors: Meyyappan M
Group Author: Sunkara Mahendra K
Published: CRC Press,
Publication Dates: c2010.
Call Number: TM24/M616

Book

3

Cover is for reference only

Proceedings of the eleventh International Symposium on Plasma Processing

Corporate Authors: Symposium on Plasma Processing (11th 1996 Los Angeles, California; Electrochemical Society. Meeting 1996 Los Angeles, California); Electrochemical Society. Dielectric Science and Technology Division; International Symposium on Plasma Processing 1996 Los Angeles, California); Electrochemical Society. Electronics Division
Group Author: Mathad G. S; Meyyappan M
Published: Electrochemical Society.
Publication Dates: c1996.
Call Number: O539-532/S989/1996/

Book

4

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Fundamental gas-phase and surface chemistry of vapor-phase deposition II and Process control, diagnostics and modeling in semiconductor manufacturing IV：proceedings of the internatioal symposium

Corporate Authors: Symposium on Fundamental Gas-Phase and Surface Chemistry of Vaper-Phase Materials Synthesis (2nd 2001 Washington, D.C; Electrochemical Society. Dielectric Science and Technology Division; Electrochemical Society. High Temperature Materials Division
Group Author: Allendorf Mark Donald; Meyyapan M; Swihart Mark T
Published: Electrochemical Society,
Publication Dates: c2001.
Call Number: O647.11-532/S989/2001

Book

5

Cover is for reference only

Proceedings of the Symposium on Process Control, Diagnostics, and Modeling in Semiconductor Manufacturing

Corporate Authors: Symposium on Process Control, Diagnostics, and Modeling in Semiconductor Manufacturing (1st 1995 Reno, Nev.); Electrochemical Society. Dielectric Science and Technology Division.; Electrochemical Society. Electronics Division.
Group Author: (Demetre John), 1958-; Butler S. W.; (Stephanie Watts), 1963-; Meyyappan M.; Economou D. J.
Published: Electrochemical Society,
Publication Dates: c1995.
Call Number: TN304.05-532/S989.1/1995/

Book

6

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Proceedings of the International Symposium on Thin Film Materials, Processes, Reliability, and Applications, Thin Film Processes

Corporate Authors: International Symposium on Thin Film Materials, Processes, Reliability, and Applications: Thin Film Processes (1997 Paris, France); Electrochemical Society. Electrodeposition Division.; Electrochemical Society. Meeting 1997 Paris, France) (Paris, France)); Electrochemical Society. Dielectric Science and Technology Division.; International Society of Electrochemistry. Meeting 1997 Paris, France) (Paris, France)); Electrochemical Society. Electronics Division.
Group Author: Engelhardt M.; (Michael); Mathad G. S.; Meyyappan M.
Published: Electrochemical Society,
Publication Dates: c1998.
Call Number: TB383-532/I617/1997

Book

7

Cover is for reference only

Principles of organic farming /

Main Authors: Somasundaram, E. (Author)
Group Author: Nandhini, D. Udhaya; Meyyappan, M.
Published: CRC Press,
Publication Dates: 2022.
Call Number: S-0/S693

Book

8

Cover is for reference only

碳纳米管：科学与应用

Main Authors: 美麦亚潘 M. Meyyappan, M. ((美)M·麦亚潘主编)
Group Author: 刘忠范 (译)
Published: 科学出版社
Publication Dates: 2007
Call Number: TB383/5413

Book

9

Cover is for reference only

Proceedings of the Symposium on Process Control, Diagnostics, and Modeling in Semiconductor Manufacturing

Corporate Authors: Symposium on Process Control, Diagnostics, and Modeling in Semiconductor Manufacturing (1995 Reno, Nev.); Electrochemical Society. Dielectric and Technology Division.; Electrochemical Society. Electronics Division.
Group Author: (Demetre John), 1958-; Butler S. W.; (Stephanie Watts), 1963-; Meyyappan M.; Economou D. J.
Published: Electrochemical Society,
Publication Dates: c1995.
Call Number: TN305-532/S989/1995

Book

10

Cover is for reference only

Proceedings of the Second International Symposium on Process Control, Diagnostics, and Modeling in Semiconductor Manufacturing

Corporate Authors: International Symposium on Process Control, Diagnostics, and Modeling in Semiconductor Manufacturing (2nd 1997 Montreal, Quebec); Electrochemical Society. Meeting 1997 Montreal, Quebec) (Montreal, Quebec)); Electrochemical Society. Dielectric and Technology Division.; Electrochemical Society. Electronics Division.
Group Author: (Demetre John), 1958-; Butler S. W.; (Stephanie Watts), 1963-; Meyyappan M.; Economou D. J.
Published: Electrochemical Society,
Publication Dates: c1997.
Call Number: TN305-532/I61.2/1997/

Book

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