Author Results for Rome Air Development Center.

Rome Air Development Center
Reliability Analysis Center U.S
Society of Photo-Optical Instrumentation Engineers
AIPR Executive Committee
AIPR Workshop,McLean, Va
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Air Force,U. S
Antenna Applications Symposium
Center for Electronics and Electrical Engineering U.S..,Semiconductor Materials and Processes Division
Cohen,Elaine C
Davis,Robert C.

2
Proceedings of the 1986 Antenna Applications Symposium

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Corporate Authors: Antenna Applications Symposium (1986)
Group Author: McGrath Daniel T
Published: Air Development Center National Technical Information Service,
Publication Dates: 1987.
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3
Microcircuit device reliability linear/interface data

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Main Authors: Flint Steven J
Corporate Authors: Reliability Analysis Center U.S; Rome Air Development Center
Published: Reliability Analysis Center, Rome Air Development Center,
Publication Dates: 1979.
Call Number: TN4-64/R382/1979/
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4
Optical signal processing for C3I, October 29-30, 1979, Boston, Massachusetts

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Corporate Authors: Rome Air Development Center; Society of Photo-Optical Instrumentation Engineers
Group Author: Miceli William J
Published: Society of Photo-optical Instrumentation Engineers,
Publication Dates: c1980.
Call Number: TN911-53/S678/1979/
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5
Linear modulation techniques for digital microwave

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Main Authors: Davis Robert C.
Corporate Authors: Rome Air Development Center.; Harris Corporation. Electronic Systems.
Published: Rome Air Development Center,
Publication Dates: 1979.
Call Number: TN761/D263/
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7
Research directions in database security

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Corporate Authors: Rome Air Development Center
Group Author: Lunt Teresa F
Published: Springer-Verlag,
Publication Dates: c1992.
Call Number: TP311.13-53/R429/1988/
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10
Microcircuit device reliability linear/interface data

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Main Authors: Hommey Gene A
Corporate Authors: Reliability Analysis Center U.S; Rome Air Development Center
Group Author: Paquette Thomas E
Published: Reliability Analysis Center, Rome Air Development Center,
Publication Dates: 1977
Call Number: TN4-64/R382/1977/
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11
Hybrid circuit data /

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Main Authors: Turner, Timothy E
Corporate Authors: Rome Air Development Center; Reliability Analysis Center U.S
Published:
Call Number: TN45/T944
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12
Memory/LSI data.

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Corporate Authors: Reliability Analysis Center U.S; Rome Air Development Center
Published:
Call Number: TN406-64/M533
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13
Microcircuit device reliability : linear/interface data /

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Main Authors: Paquette, Thomas E
Corporate Authors: Rome Air Development Center
Published:
Call Number: TN406/P219
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