Author Results for Wang, Laung-Terng

Elsevier Science & Technology
Wang,Laung-Terng
Wen,Xiaoqing
Wu,Cheng-Wen,
edited by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen

1
VLSI test principles and architectures design for testability

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Group Author: Wang Laung-Terng; Wu Cheng-Wen, EE Ph. D; Wen Xiaoqing
Published: Elsevier Morgan Kaufmann Publishers,
Publication Dates: c2006.
Call Number: TN47/V871
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2
System-on-chip test architectures : nanometer design for testability /

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Corporate Authors: Elsevier Science & Technology
Group Author: Wang, Laung-Terng; Stroud, Charles E; Touba, Nur A
Published: Morgan Kaufmann Publishers,
Publication Dates: 2008.
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3
Electronic design automation : synthesis, verification, and test /

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Corporate Authors: Elsevier Science & Technology
Group Author: Wang, Laung-Terng; Chang, Yao-Wen; Cheng, Kwang-Ting, 1961
Published: Morgan Kaufmann Publishers/Elsevier,
Publication Dates: 2009.
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5
VLSI test principles and architectures : design for testability /

Cover is for reference only
Corporate Authors: Elsevier Science & Technology
Group Author: Wang, Laung-Terng; Wu, Cheng-Wen, EE Ph. D; Wen, Xiaoqing
Published: Elsevier Morgan Kaufmann Publishers,
Publication Dates: 2006.
eBook
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