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19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems：proceedings : 10-13 October, 2004, Cannes, France

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Bibliographic Details
Corporate Authors: IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (19th 2004 Cannes, France; IEEE Computer Society. Fault-Tolerant Computing Technical Committee; IEEE Computer Society. Test Technology Technical Committee
Published: IEEE Computer Society Press,
Publisher Address: Los Alamitos, Calif.
Publication Dates: c2004.
Literature type: Book
Language: English
Subjects:
Integrated circuits > Very large scale integration > Design and construction
Fault-tolerant computing
Carrier Form: xii, 506 p.: ill. ; 23 cm.
Publication Frequency: Also available via the World Wide Web.
ISBN: 0769522416
Index Number: TP302
CLC: TP302.8-532
TN470.9-532
Call Number: TP302.8-532/I59/2004
Contents: "DPT 2004"--half T.p.
"IEEE Computer Society Order Number P2241"--T.p. verso.
Includes bibliographical references and author index.

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