Applications and metrology at nanometer scale. 1, Smart materials, electromagnetic waves and uncertainties/
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Main Authors: | |
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Corporate Authors: | |
Group Author: | ; |
Published: |
ISTE Ltd. ; Wiley,
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Publisher Address: | London : Hoboken : |
Publication Dates: | 2021. |
Literature type: | eBook |
Language: | English |
Series: |
Mechanical engineering and solid mechanics series. Reliability of multiphysical systems set ; v. 9 |
Subjects: | |
Online Access: |
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119808244 |
Item Description: | Description based on print version record. |
Carrier Form: |
1 online resource (248 pages). Also available in print. |
Bibliography: | Includes bibliographical references and index. |
ISBN: |
9781119808244 1786306409 9781786306401 |
Index Number: | QC88 |
CLC: | TB9 |
Contents: | Nanometer Scale -- Statistical Tools to Reduce the Effect of Design Uncertainties -- Electromagnetic Waves and Their Applications -- Smart Materials -- Propagation of a Light Ray -- References -- Index -- Other titles from iSTE in Mechanical Engineering and Solid Mechanics. |